SureView has developed an automated inspection system for Semi-conductor wafers (chips) based on Machine Vision. Based on our competency in test & measurement of over 4 decades, we have developed this equipment in India for manufacturers of semi-conductors. This system consists of a high resolution frame-grabber, synchronized illumination, machine vision algorithm and other allied accessories.  This … Continue reading Test Equipment for Semi-conductor Wafers (Chips) using Computer Vision